Coherent x-ray scattering and lensless imaging at the european XFEL facility

被引:31
|
作者
Vartanyants, I. A.
Robinson, I. K.
McNulty, I.
David, C.
Wochner, P.
Tschentscher, Th.
机构
[1] DESY, HASYLAB, D-22607 Hamburg, Germany
[2] UCL, London Ctr Nanotechnol, Dept Phys & Astron, London WC1E 6BT, England
[3] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[4] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[5] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
基金
英国工程与自然科学研究理事会;
关键词
x-ray free-electron laser; coherent X-ray diffraction imaging; phase retrieval;
D O I
10.1107/S0909049507037600
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Coherent X-ray diffraction imaging is a rapidly advancing form of lensless microscopy. The phase information of the diffraction pattern is embedded in a sufficiently sampled coherent diffraction pattern. Using advanced computational methods, this diffraction pattern can be inverted to produce an image of a sample with diffraction-limited resolution. It is attractive to use high-power coherent X-ray beams produced by future X-ray free-electron lasers for imaging nanoscale condensed matter, materials and biological samples. Here, the scientific case, requirements and the possible realisation of the coherent X-ray diffraction imaging beamlines at the European XFEL Facility are presented.
引用
收藏
页码:453 / 470
页数:18
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