Uniaxial pressure in a High-resolution X-ray Diffraction environment

被引：0
|
作者：
Frehse, V. E. S. [1 ,2 ]
Lombardi, G. A. [1 ,2 ]
Corsaletti Filho, J. C. [1 ]
Adriano, C. [2 ]
dos Reis, R. D. [1 ]
Calligaris, G. A. [1 ]
机构：
[1] Brazilian Ctr Res Energy & Mat, Brazilian Synchrotron Light Lab, BR-13083970 Campinas, SP, Brazil
[2] Univ Campinas UNICAMP, Inst Phys Gleb Wataghin, BR-13083859 Campinas, SP, Brazil
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2021年 / 77卷
关键词：
Uniaxial pressure; Single crystal diffraction; Synchrotron beamline; Mn3Ge;
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
PS-50-5
引用
收藏
页码：C1215 / C1215
页数：1
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