Direct characterization of nanoscale domain switching and local piezoelectric loops of (Pb,La)TiO3 thin films by piezoresponse force microscopy

被引:6
作者
Poyato, R
Calzada, ML
Shvartsman, VV
Kholkin, A
Vilarinho, P
Pardo, L
机构
[1] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain
[2] Univ Aveiro, Dept Engn Ceram & Vidro, P-3180193 Aveiro, Portugal
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2005年 / 81卷 / 06期
关键词
D O I
10.1007/s00339-004-2969-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
< 111 > and < 001 >, < 100 > preferentially oriented lanthanum-modified lead titanate thin films have been studied at the nanometre scale by means of piezoresponse force microscopy. The nanoscale domain structures, domain switching, and local piezoelectric loops of the films have been analysed. The imaging of the domain structures after the application of a dc field suggests the existence of 90 degrees and 180 degrees domains within the regions with intermediate contrast. The variation of piezoresponse under an electric field in domains of two types has been discussed. Significant differences have been found between the local piezoelectric loops measured in the films deposited on different substrates. These differences are related to the different textures present in the films.
引用
收藏
页码:1207 / 1212
页数:6
相关论文
共 29 条
[1]   Stress-induced depolarization of (Pb, La)TiO3 ferroelectric thin films by nanoindentation [J].
Algueró, M ;
Bushby, AJ ;
Reece, MJ ;
Poyato, R ;
Ricote, J ;
Calzada, ML ;
Pardo, L .
APPLIED PHYSICS LETTERS, 2001, 79 (23) :3830-3832
[2]   The physics of ferroelectric memories [J].
Auciello, O ;
Scott, JF ;
Ramesh, R .
PHYSICS TODAY, 1998, 51 (07) :22-27
[3]   Chemistry-crystallization-microstructure relations of sol-gel derived lanthanum modified lead titanate thin films [J].
Calzada, ML ;
Algueró, M ;
Pardo, L .
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 1998, 13 (1-3) :837-841
[4]   Scanning probe microscopy observation of nanoscale domain switching in sol-gel PbTiO3 thin films [J].
Chen, XF ;
Zhu, WG ;
Tan, OK ;
Yao, X .
MATERIALS CHEMISTRY AND PHYSICS, 2002, 75 (1-3) :90-94
[5]   Scanning probe microscopy of domains and domain walls in sol-gel PbTiO3 thin films [J].
Chen, XF ;
Zhu, WG ;
Liu, WG ;
Wang, ZH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (06) :2258-2261
[6]   Piezoelectric measurements with atomic force microscopy [J].
Christman, JA ;
Woolcott, RR ;
Kingon, AI ;
Nemanich, RJ .
APPLIED PHYSICS LETTERS, 1998, 73 (26) :3851-3853
[7]   Direct observation of region by region suppression of the switchable polarization (fatigue) in Pb(Zr,Ti)O3 thin film capacitors with Pt electrodes [J].
Colla, EL ;
Hong, SB ;
Taylor, DV ;
Tagantsev, AK ;
Setter, N ;
No, K .
APPLIED PHYSICS LETTERS, 1998, 72 (21) :2763-2765
[8]   MODIFICATION AND DETECTION OF DOMAINS ON FERROELECTRIC PZT FILMS BY SCANNING FORCE MICROSCOPY [J].
FRANKE, K ;
BESOLD, J ;
HAESSLER, W ;
SEEGEBARTH, C .
SURFACE SCIENCE, 1994, 302 (1-2) :L283-L288
[9]   Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O-3 films [J].
Gruverman, A ;
Auciello, O ;
Tokumoto, H .
APPLIED PHYSICS LETTERS, 1996, 69 (21) :3191-3193
[10]   Scaling effect on statistical behavior of switching parameters of ferroelectric capacitors [J].
Gruverman, A .
APPLIED PHYSICS LETTERS, 1999, 75 (10) :1452-1454