Antenna Characterization From a Small Number of Far-Field Measurements via Reduced-Order Models

被引:7
作者
Mezieres, Nicolas [1 ,2 ,3 ]
Mattes, Michael [4 ]
Fuchs, Benjamin [5 ]
机构
[1] Inst Elect & Telecommun Rennes IETR, F-35065 Rennes, France
[2] Ctr Natl Etud Spatiales CNES, F-31401 Paris, France
[3] Lab Natl Metrol & Essais LNE, F-75015 Paris, France
[4] Tech Univ Denmark, DK-2800 Lyngby, Denmark
[5] Inst Elect & Telecommun Rennes IETR, UMR CNRS 6164, F-35042 Rennes, France
关键词
Antenna measurements; Antenna radiation patterns; Surface impedance; Reduced order systems; Matrix decomposition; Mathematical models; Current distribution; antenna radiation pattern; method of moments; reduced-order systems; NEAR-FIELD; SOURCE RECONSTRUCTION; RADIATED FIELDS; SURFACES;
D O I
10.1109/TAP.2021.3118711
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The determination of a small number of samples to characterize the antenna far-field with a controlled accuracy is addressed. The radiation operator that maps the equivalent currents to the far-field is built from the outer dimensions of the antenna under test (AUT) and is discretized into the so-called radiation matrix using the methods of moments. This matrix is approximated up to the measurement accuracy by truncating its singular value decomposition (SVD) accordingly. This operation enables to construct numerically a reduced basis of the radiated fields. The dimension of this basis and consequently the number of field samples is shown to be determined by the area of the equivalent current convex surface, in agreement with the fundamental works on the minimum non-redundant samplings. The influence of the field sampling strategy and noise on the far-field pattern reconstruction is investigated to determine a realistic small number of field samples. Finally, the characterization of two radiating structures from the so-derived reduced number of samples validates experimentally the proposed approach and demonstrates its practical relevance.
引用
收藏
页码:2422 / 2430
页数:9
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