Confocal photo-stimulated micro spectroscopy (CPSM) -: residual stress measurements in Al2O3 using confocal microscopy

被引：15
作者：
Hovis, DB [1 ]
Heuer, AH [1 ]
机构：
[1] Case Western Reserve Univ, Dept Mat Sci & Engn, Cleveland, OH 44106 USA
来源：
SCRIPTA MATERIALIA | 2005年 / 53卷 / 03期
关键词：
thermally grown-oxide (TGO); residual stresses; microstructure; optical spectroscopy;
D O I：
10.1016/j.scriptamat.2005.04.016
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A new technique, confocal photo-stimulated microspectroscopy (CPSM), was used to measure the residual stress of the thermally grown oxide (TGO) on several Al2O3-scale forming M-based alloys. CPSM provides improved resolution over previous techniques, and has revealed residual stress variations as large as 3 GPa over 1.5 mu m. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：347 / 349
页数：3
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