Confocal photo-stimulated micro spectroscopy (CPSM) -: residual stress measurements in Al2O3 using confocal microscopy

被引：15

作者：

Hovis, DB ^{[1
]}

Heuer, AH ^{[1
]}

机构：

[1] Case Western Reserve Univ, Dept Mat Sci & Engn, Cleveland, OH 44106 USA

来源：

SCRIPTA MATERIALIA | 2005年 / 53卷 / 03期

关键词：

thermally grown-oxide (TGO); residual stresses; microstructure; optical spectroscopy;

D O I：

10.1016/j.scriptamat.2005.04.016

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A new technique, confocal photo-stimulated microspectroscopy (CPSM), was used to measure the residual stress of the thermally grown oxide (TGO) on several Al2O3-scale forming M-based alloys. CPSM provides improved resolution over previous techniques, and has revealed residual stress variations as large as 3 GPa over 1.5 mu m. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：347 / 349

页数：3

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