Effect of microstructure on the microwave properties in dielectric ceramics

被引:22
作者
Park, JH [1 ]
Kim, BK [1 ]
Park, JG [1 ]
Kim, Y [1 ]
机构
[1] KIST, Div Mat, Korea Inst Sci & Technol, Seoul 136791, South Korea
关键词
cavity resonators; electromagnetic simulation; microwave ceramics; quality factor;
D O I
10.1016/S0955-2219(01)00342-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Electromagnetic simulation of the quality factor measurement was compared to the measurement with a network analyzer. Scattering matrix S-21 obtained from the network analyzer was compared to the S-21 obtained from the simulation. From electric field distribution, the dominant resonant TE01 delta mode could be easily determined. The effects of the pore and the conductive inclusion inside the dielectric were investigated. The quality factor decreased with the pore and the second phase in the dielectrics. The decrease of quality factor is more significant when dielectric have conductive inclusions inside the dielectric. Due to the limitations in computer resources and analysis time, the size of the inclusions inside the dielectrics in simulation are not actual size. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:2669 / 2672
页数:4
相关论文
共 8 条
  • [1] Hakki B. W., 1960, IEEE Trans. Microwave Theory Techn, V8, P402, DOI DOI 10.1109/TMTT.1960.1124749
  • [2] Harrington R. F., 1961, TIME HARMONIC ELECTR
  • [3] Kajfez D., 1986, DIELECTRIC RESONATOR
  • [4] MATTHEW N, 1992, NUMERICAL TECHNIQUES
  • [5] Pozar D. M., 2009, MICROWAVE ENG
  • [6] Dielectric resonators
    Richtmyer, RD
    [J]. JOURNAL OF APPLIED PHYSICS, 1939, 10 (06) : 391 - 398
  • [7] Wakino K., 1986, ISAF '86. Proceedings of the Sixth IEEE International Symposium on Applications of Ferroelectrics (Cat. No.86CH2358-0), P97
  • [8] 1999, ANSOFT HFSS USERS MA