Classical model of extrinsic ferromagnetic resonance linewidth in ultrathin films

被引：138

作者：

McMichael, RD ^{[1
]}

Krivosik, P

机构：

[1] NIST, Gaithersburg, MD 20899 USA

[2] Colorado State Univ, Dept Phys, Ft Collins, CO 80523 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2004年 / 40卷 / 01期

基金：

美国国家科学基金会;

关键词：

ferromagnetic resonance; linewidth; magnetization dynamics;

D O I：

10.1109/TMAG.2003.821564

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes a classical version of the two-magnon model of ferromagnetic resonance linewidth in inhomogeneous magnetic thin films. The ferromagnetic resonance line broadening due to inhomogeneity is described in terms of film properties and the statistical properties of the inhomogeneity. Analytical results for the case of ultrathin films in the limit of zero damping are compared with numerical results computed with finite damping.

引用

页码：2 / 11

页数：10

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