Lifetime Modelling of Power Electronics for Power Electronic Based Power System-A Case for Microgrids

被引:1
作者
Li, Chendan [1 ]
Spro, Ole Christian [1 ]
Fosso, Olav Bjarte [1 ]
机构
[1] Norwegian Univ Sci & Technol NTNU, Dept Elect Power Engn, Trondheim, Norway
来源
2021 IEEE IAS INDUSTRIAL AND COMMERCIAL POWER SYSTEM ASIA (IEEE I&CPS ASIA 2021) | 2021年
关键词
lifetime modelling; power electronics; reliability; microgrid; IGBT; RELIABILITY;
D O I
10.1109/ICPSAsia52756.2021.9621548
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Lifetime is an important indicator of system reliability. With the paradigm power system evolves into a power electronics based power system, lifetime modelling method for power electronics needs to be revisited and perspective for modelling power electronics lifetime for system planning and operation usage is worth looking at. In this paper, the existent methods for modelling lifetime for power electronic system are reviewed and classified. The purpose of the paper is to give a brief overview of different modeling methods for power electronics lifetime, and to introduce how this lifetime information can be used for the system level reliability for the power electronics based power system taking the example of the microgrid application. New concept of system level reliability management based on lifetime model is envisaged.
引用
收藏
页码:483 / 488
页数:6
相关论文
共 24 条
[1]   Junction Temperature Control for More Reliable Power Electronics [J].
Andresen, Markus ;
Ma, Ke ;
Buticchi, Giampaolo ;
Falck, Johannes ;
Blaabjerg, Frede ;
Liserre, Marco .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2018, 33 (01) :765-776
[2]   Study of reliability-efficiency tradeoff of active thermal control for power electronic systems [J].
Andresen, Markus ;
Buticchi, Giampaolo ;
Liserre, Marco .
MICROELECTRONICS RELIABILITY, 2016, 58 :119-125
[3]  
[Anonymous], 2007, Life cycle reliability engineering, DOI DOI 10.1002/9780470117880
[4]   Limitations and Guidelines for Damage Estimation Based on Lifetime Models for High-Power IGBTs in Realistic Application Conditions [J].
Antonopoulos, Antonios ;
D'Arco, Salvatore ;
Hernes, Magnar ;
Peftitsis, Dimosthenis .
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2021, 9 (03) :3598-3609
[5]  
Chendan Li, 2020, 2020 IEEE 4th Conference on Energy Internet and Energy System Integration (EI2), P982, DOI 10.1109/EI250167.2020.9347144
[6]   Study on Effect of Junction Temperature Swing Duration on Lifetime of Transfer Molded Power IGBT Modules [J].
Choi, Ui-Min ;
Blaabjerg, Frede ;
Jorgensen, Soren .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2017, 32 (08) :6434-6443
[7]   A state-of-the-art review on fatigue life prediction methods for metal structures [J].
Cui, WC .
JOURNAL OF MARINE SCIENCE AND TECHNOLOGY, 2002, 7 (01) :43-56
[8]   Recent Developments in Machine Learning for Energy Systems Reliability Management [J].
Duchesne, Laurine ;
Karangelos, Efthymios ;
Wehenkel, Louis .
PROCEEDINGS OF THE IEEE, 2020, 108 (09) :1656-1676
[9]  
Kovacevic I. F., 2010, 2010 International Power Electronics Conference (IPEC - Sapporo), P2106, DOI 10.1109/IPEC.2010.5543755
[10]  
Leemis L.M., 1995, RELIABILITY PROBABIL