Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1-xKxFe2As2 superconductors

被引：25

作者：

Wang, Lei ^{[1
]}

Ma, Yanwei ^{[1
]}

Wang, Qingxiao ^{[2
]}

Li, Kun ^{[2
]}

Zhang, Xixiang ^{[2
]}

Qi, Yanpeng ^{[1
]}

Gao, Zhaoshun ^{[1
]}

Zhang, Xianping ^{[1
]}

Wang, Dongliang ^{[1
]}

Yao, Chao ^{[1
]}

Wang, Chunlei ^{[1
]}

机构：

[1] Chinese Acad Sci, Key Lab Appl Superconduct, Inst Elect Engn, Beijing 100190, Peoples R China

[2] King Abdullah Univ Sci & Technol, Imaging & Characterizat Core Lab, Thuwal 239556900, Saudi Arabia

来源：

APPLIED PHYSICS LETTERS | 2011年 / 98卷 / 22期

基金：

美国国家科学基金会;

关键词：

WIRES;

D O I：

10.1063/1.3592580

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report here an atomic resolution study of the structure and composition of the grain boundaries in polycrystalline Sr0.6K0.4Fe2As2 superconductor. A large fraction of grain boundaries contain amorphous layers larger than the coherence length, while some others contain nanometer-scale crystallites sandwiched in between amorphous layers. We also find that there is significant oxygen enrichment at the grain boundaries. Such results explain the relatively low transport critical current density (J(c)) of polycrystalline samples with respect to that of bicrystal films. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3592580]

引用

页数：3

共 14 条

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