Identification of Mn-related Raman modes in Mn-doped ZnO thin films

被引:30
作者
Hu, Y. M. [1 ]
Wang, C. Y. [1 ]
Lee, S. S. [1 ]
Han, T. C. [1 ]
Chou, W. Y. [2 ]
Chen, G. J. [3 ]
机构
[1] Natl Univ Kaohsiung, Dept Appl Phys, Kaohsiung 811, Taiwan
[2] Natl Cheng Kung Univ, Inst Electroopt Sci & Engn, Tainan 701, Taiwan
[3] I Shou Univ, Dept Mat Sci & Engn, Kaohsiung 840, Taiwan
关键词
zinc oxide; manganese; Raman spectroscopy; Mn(2)O(3); sputtering; ZINC-OXIDE; FERROMAGNETISM; NANOPARTICLES; TEMPERATURE; SCATTERING; SPECTRA;
D O I
10.1002/jrs.2695
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
This article aims to investigate the Raman modes present in Mn-doped ZnO thin films that are deposited using the magnetron co-sputtering method. A broad band ranging from 500 to 590 cm(-1) is present in the Raman spectra of heavily Mn-doped ZnO films. The multi-peak-fitting results show that this broad band may be composed of six peaks, and the peak at 528 cm(-1) could be a characteristic mode of Mn(2)O(3). The results of this study suggest that the origin of the Raman peaks in Mn-doped ZnO films may be due to three major types: structural disorder and morphological changes caused by the Mn dopant, Mn-related oxides and intrinsic host-lattice defects. Copyright (C) 2010 John Wiley & Sons, Ltd.
引用
收藏
页码:434 / 437
页数:4
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