共 37 条
[1]
[Anonymous], 2020, ATLAS 3D DEVICE SIMU
[5]
Dubey M., 2010, J APPL PHYS, V108, P1, DOI [10.1063/1.3488605, DOI 10.1063/1.3488605]
[10]
Physics-based analytic modeling and simulation of gate-induced drain leakage and linearity assessment in dual-metal junctionless accumulation nano-tube FET (DM-JAM-TFET)
[J].
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,
2020, 126 (05)