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Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices
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2014 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW),
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Fast-neutron testing at the University of Washington Medical Cyclotron Facility
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64MeV Proton single-event evaluation of Xilinx Single Event Mitigation (XilSEM) firmware on 7nm Versal™ ACAP devices
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2022 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) (IN CONJUNCTION WITH 2022 NSREC),
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