Shape recovery of nanoscale imprints in a thermoset "shape memory" polymer

被引：44
作者：
Nelson, BA [1 ]
King, WP
Gall, K
机构：
[1] Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30080 USA
[2] Univ Colorado, Dept Mech Engn, Boulder, CO 80309 USA
来源：
APPLIED PHYSICS LETTERS | 2005年 / 86卷 / 10期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.1868883
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
This letter reports temperature-dependent recovery of atomic force microscope tip-formed indentations in a thermoset shape memory polymer. The indentations are made at both room temperature and 69 degrees C, and then recovered at temperatures between 40 degrees C and 70 degrees C. The shape recovery is more complete for higher anneal temperatures, and is relatively independent of time for 10(2)-10(4) s. The experiments show shape memory in the 1 - 100 nm size scale. (c) 2005 American Institute of Physics.
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页码：1 / 3
页数：3
相关论文
共 29 条
[1]   Imprint lithography with 25-nanometer resolution [J].
Chou, SY ;
Krauss, PR ;
Renstrom, PJ .
SCIENCE, 1996, 272 (5258) :85-87
[2]  
*COMP TECHN DEV IN, CTD DP5
[3]  
El Feninat F, 2002, ADV ENG MATER, V4, P91, DOI 10.1002/1527-2648(200203)4:3<91::AID-ADEM91>3.0.CO
[4]  
2-B
[5]   Shape memory polymer nanocomposites [J].
Gall, K ;
Dunn, ML ;
Liu, YP ;
Finch, D ;
Lake, M ;
Munshi, NA .
ACTA MATERIALIA, 2002, 50 (20) :5115-5126
[6]  
GALL K, IN PRESS J MICROELEC
[7]  
Jeon HG, 2000, POLYM INT, V49, P453, DOI 10.1002/(SICI)1097-0126(200005)49:5<453::AID-PI332>3.0.CO
[8]  
2-H
[9]   Shape memory polyurethane containing amorphous reversible phase [J].
Jeong, HM ;
Lee, SY ;
Kim, BK .
JOURNAL OF MATERIALS SCIENCE, 2000, 35 (07) :1579-1583
[10]   Atomic force microscope cantilevers for combined thermomechanical data writing and reading [J].
King, WP ;
Kenny, TW ;
Goodson, KE ;
Cross, G ;
Despont, M ;
Dürig, U ;
Rothuizen, H ;
Binnig, GK ;
Vettiger, P .
APPLIED PHYSICS LETTERS, 2001, 78 (09) :1300-1302
123