Determination of material properties and failure using in-situ thermo-mechanical probe
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作者:
Arrazat, B.
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机构:
Ecole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Arrazat, B.
[1
]
Orellana, S.
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机构:
Mines ParisTech, CEMEF UMR CNRS 7635, F-06904 Sophia Antipolis, France
STMicroelectronics, TR&D, F-13106 Rousset, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Orellana, S.
[2
,3
]
Rivero, C.
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机构:
STMicroelectronics, TR&D, F-13106 Rousset, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Rivero, C.
[3
]
Fornara, P.
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机构:
STMicroelectronics, TR&D, F-13106 Rousset, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Fornara, P.
[3
]
Di-Giacomo, A.
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机构:
STMicroelectronics, TR&D, F-13106 Rousset, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Di-Giacomo, A.
[3
]
Blayac, S.
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机构:
Ecole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Blayac, S.
[1
]
Montmitonnet, P.
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机构:
Mines ParisTech, CEMEF UMR CNRS 7635, F-06904 Sophia Antipolis, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Montmitonnet, P.
[2
]
Inal, K.
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机构:
Mines ParisTech, CEMEF UMR CNRS 7635, F-06904 Sophia Antipolis, FranceEcole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
Inal, K.
[2
]
机构:
[1] Ecole Natl Super Mines, CMP, 880 Route Mimet, F-13541 Gardanne, France
[2] Mines ParisTech, CEMEF UMR CNRS 7635, F-06904 Sophia Antipolis, France
[3] STMicroelectronics, TR&D, F-13106 Rousset, France
来源:
2014 SYMPOSIUM ON DESIGN, TEST, INTEGRATION AND PACKAGING OF MEMS/MOEMS (DTIP)
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2014年
关键词:
Back-End of Line (BEoL);
embedded sensor;
thermo-mechanical properties;
Joule effect;
Finite Element Modeling;
in-situ SEM nano-probing;
failure mechanisms;
STRESS;
METALLIZATION;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A metallic in-situ stress sensor is modified to address electrical polarization and thus to locally heat this sensor by Joule effect. By coupling SEM electrical nano-probing with analytical modeling and multiphysics Finite Element Method (FEM), the thermo-mechanical properties are identified. As a result, a tensile stress state of 190 MPa, coefficient of thermal expansion of 22.5x10(-6) K-1 and thermal conductivity of 190 W/(K. m) are identified in the aluminum thin film in agreement with literature. Moreover, high current induces irreversible deformation and breaking. Using multiphysics FE model with identified thermo-mechanical properties, the failure of the sensor under electrical solicitation is investigated. The evolution of local temperature and mechanical deformation on different sensor designs allows the determination of the breaking location and condition.