Application of image plate for structural studies of carbon nanotubes by high-energy X-ray diffraction

被引：23
作者：
Hawelek, L
Koloczek, J
Burian, A
Dore, JC
Honkimäki, V
Kyotani, T
机构：
[1] Silesian Univ, A Chelkowski Inst Phys, PL-40007 Katowice, Poland
[2] Univ Kent, Sch Phys Sci, Canterbury CT2 7NR, Kent, England
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[4] Tohoku Univ, Inst Multidisciplinary Res & Adv Mat, Sendai, Miyagi 9808577, Japan
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2005年 / 401卷 / 1-2期
关键词：
nanostructures; X-ray diffraction; synchrotron radiation;
D O I：
10.1016/j.jallcom.2005.02.061
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
An image plate detector coupled with high-energy synchrotron radiation was used to determine the structure factor and the radial distribution function of carbon nanotubes obtained by a template CVD process. The image plate detector has proved to be a very efficient tool for structural studies of nanotubes providing diffraction data of good quality in relatively short time. The diffraction data were converted to real space yielding the radial distribution function which can be used for quantitative analysis of the atomic arrangement of the carbon nanotubes. The obtained results are compared to those of traditional experiments using a conventional point Ge detector. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：51 / 54
页数：4
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