Multibit memory operation of metal-oxide bi-layer memristors

被引:233
作者
Stathopoulos, Spyros [1 ]
Khiat, Ali [1 ]
Trapatseli, Maria [1 ]
Cortese, Simone [1 ]
Serb, Alexantrou [1 ]
Valov, Ilia [2 ]
Prodromakis, Themis [1 ]
机构
[1] Univ Southampton, Fac Phys Sci & Engn, Dept Elect & Comp Sci, Univ Rd, Southampton SO17 1BJ, Hants, England
[2] Forschungszentrum Julich, Wilhelm Johnen Str, D-52428 Julich, Germany
基金
英国工程与自然科学研究理事会;
关键词
HIGH-DENSITY; SWITCHING MECHANISM; NONVOLATILE; TAOX; RRAM;
D O I
10.1038/s41598-017-17785-1
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Emerging nanoionic memristive devices are considered as the memory technology of the future and have been winning a great deal of attention due to their ability to perform fast and at the expense of low-power and - space requirements. Their full potential is envisioned that can be fulfilled through their capacity to store multiple memory states per cell, which however has been constrained so far by issues affecting the long-term stability of independent states. Here, we introduce and evaluate a multitude of metal-oxide bi-layers and demonstrate the benefits from increased memory stability via multibit memory operation. We propose a programming methodology that allows for operating metal-oxide memristive devices as multibit memory elements with highly packed yet clearly discernible memory states. These states were found to correlate with the transport properties of the introduced barrier layers. We are demonstrating memory cells with up to 6.5 bits of information storage as well as excellent retention and power consumption performance. This paves the way for neuromorphic and non-volatile memory applications.
引用
收藏
页数:7
相关论文
共 49 条
[1]   Resistive switching characteristics in memristors with Al2O3/TiO2 and TiO2/Al2O3 bilayers [J].
Alekseeva, Liudmila ;
Nabatame, Toshihide ;
Chikyow, Toyohiro ;
Petrov, Anatolii .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2016, 55 (08)
[2]  
[Anonymous], 2014, J APPL PHYS, V116
[3]   Highly scalable non-volatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses [J].
Baek, IG ;
Lee, MS ;
Seo, S ;
Lee, MJ ;
Seo, DH ;
Suh, DS ;
Park, JC ;
Park, SO ;
Kim, HS ;
Yoo, IK ;
Chung, UI ;
Moon, JT .
IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2004, TECHNICAL DIGEST, 2004, :587-590
[4]  
Baeumer C, 2015, NATURE COMMUNICATION, V6
[5]   Preface: Science of ferroelectric thin films and application to devices [J].
Baik, Sunggi ;
Setter, Nava ;
Auciello, Orlando .
JOURNAL OF APPLIED PHYSICS, 2006, 100 (05)
[6]   A μ-Controller-Based System for Interfacing Selectorless RRAM Crossbar Arrays [J].
Berdan, Radu ;
Serb, Alexander ;
Khiat, Ali ;
Regoutz, Anna ;
Papavassiliou, Christos ;
Prodromakis, Themis .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 62 (07) :2190-2196
[7]   'Memristive' switches enable 'stateful' logic operations via material implication [J].
Borghetti, Julien ;
Snider, Gregory S. ;
Kuekes, Philip J. ;
Yang, J. Joshua ;
Stewart, Duncan R. ;
Williams, R. Stanley .
NATURE, 2010, 464 (7290) :873-876
[8]   USE OF RUTHERFORD BACKSCATTERING TO STUDY BEHAVIOR OF ION-IMPLANTED ATOMS DURING ANODIC-OXIDATION OF ALUMINUM - AR, KR, XE, K, RB, CS, CL, BR, AND I [J].
BROWN, F ;
MACKINTOSH, WD .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (08) :1096-1102
[9]   X-ray spectromicroscopy investigation of soft and hard breakdown in RRAM devices [J].
Carta, D. ;
Guttmann, P. ;
Regoutz, A. ;
Khiat, A. ;
Serb, A. ;
Gupta, I. ;
Mehonic, A. ;
Buckwell, M. ;
Hudziak, S. ;
Kenyon, A. J. ;
Prodromakis, T. .
NANOTECHNOLOGY, 2016, 27 (34)
[10]   Investigation of the Switching Mechanism in TiO2-Based RRAM: A Two-Dimensional EDX Approach [J].
Carta, Daniela ;
Salaoru, Iulia ;
Khiat, Ali ;
Regoutz, Anna ;
Mitterbauer, Christoph ;
Harrison, Nicholas M. ;
Prodromakis, Themistoklis .
ACS APPLIED MATERIALS & INTERFACES, 2016, 8 (30) :19605-19611