Effect of substrate temperature on structural and optical properties of reactive dc magnetron sputtered CdZnO thin films

被引:0
作者
Kumar, A. GuruSampath [1 ]
Sarmash, T. Sofi [1 ]
Obulapathi, L. [2 ]
Rani, D. Jhansi [1 ]
Rao, T. Subba [1 ]
Asokan, K. [3 ]
机构
[1] Sri Krishnadevaraya Univ, Dept Phys, Anantapuramu 515003, AP, India
[2] Annamacharaya Inst Tech & Sci, Dept Phys, Rajampet 516126, AP, India
[3] Interuniv Accelerator Ctr, Aruna Asaf Ali Marg, New Delhi 110067, India
关键词
GAXRD; CdZnO thin films; optical band gap; substrate temperature; ELECTRICAL-PROPERTIES; ZNO FILMS; DEPOSITION;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of ternary cadmium zinc oxide (CdZnO) were prepared on glass substrates by dc magnetron sputtering technique at different substrate temperatures (RT, 100 degrees C, 200 degrees C & 300 degrees C). The structural and optical properties of the films are investigated by glancing angle x-ray diffraction (GAXRD) and UV-vis-NIR spectroscopy measurements respectively. GAXRD pattern confirmed the hexagonal wurtzite structure with a preferred grain orientation in (002) direction for all the samples. The optical studies reveal that, the optical band gap was decreased from 3.25eV to 2.88eV with increase of substrate temperature. (C) 2015Elsevier Ltd. All rights reserved.
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页码:1604 / 1608
页数:5
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