Response operator in semiconductor gamma-ray spectrometry

被引:0
作者
Krnac, S
Povinec, P
Ragan, P
机构
[1] INT ATOM ENERGY AGCY, MEL, MONACO
[2] INST PREVENT & CLIN MED, BRATISLAVA, SLOVAKIA
来源
JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES | 1996年 / 209卷 / 02期
关键词
D O I
10.1007/BF02040473
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A response operator technique for analysis of semiconductor gamma-ray spectra utilizing vector model of scaling confirmatory factor analysis (SCFA) is presented. It has been pointed out that the new vector SCFA approach yields a noticeable rise of sensitivy of the semiconductor method for a great deal of spectrometric applications. it results to considerable detection limit decreasing (4-10 times for MSA) as compared to the commonly used traditional approach (peak net area calculation of full energy peak).
引用
收藏
页码:367 / 371
页数:5
相关论文
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[Anonymous], ANAL CHEM
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DEBERTIN K, 1988, GAMA XRAY SPECTROMET
[4]  
KRNAC S, 1995, RADIAT PROT DOSIM, V58, P217
[5]  
POVINEC P, 1986, NUCL INSTRUM METH B, V17, P377
[6]  
SHAFROTH SM, 1967, SCINAILLTION SPECTRO