Application of AFM in Microbiology: A Review

被引：89

作者：

Liu, Shaoyang ^{[1
]}

Wang, Yifen ^{[1
]}

机构：

[1] Auburn Univ, Biosyst Engn Dept, Auburn, AL 36849 USA

来源：

SCANNING | 2010年 / 32卷 / 02期

关键词：

atomic force microscopy; microbiology; topography; force-distance curve; tip modification; ATOMIC-FORCE MICROSCOPY; SCANNING PROBE; SPECTROSCOPY; BACTERIA; ADHESION; NANOSTRUCTURES; MICROORGANISMS; LOCALIZATION; INTERFACES; CHITOSANS;

D O I：

10.1002/sca.20173

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Atomic force microscopy (AFM) is a powerful tool for microbiological investigation This versatile technique cannot only image cellular surfaces at high resolution, but also measure Many forms of fundamental interactions over scales ranging from molecules to cells In this work, we review the recent development of AFM applications in the microbial area We discuss several approaches for using AFM scanning images to investigate morphological characteristics of microbes and the use of force-distance curves to investigate interaction of microbial samples at the nanometer and cellular levels Complementary techniques used in combination with AFM for study of microbes are also discussed SCANNING 32. 61-73, 2010 (C) 2010 Wiley Periodicals, Inc

引用

页码：61 / 73

页数：13

共 63 条

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