Preparation and characterization of fiber-textured SrAl2O4:Eu films grown using a homo-buffer layer

被引：9

作者：

Fu, Xiaoyan ^{[1
]}

Yamada, Hiroshi ^{[1
]}

Nishikubo, Keiko ^{[1
]}

Zhang, Hongwu ^{[1
]}

Xu, Chao-Nan ^{[1
,2
]}

机构：

[1] Natl Inst Adv Ind Sci & Technol AIST Kyushu, Saga 8410052, Japan

[2] Japan Sci & Technol Corp, CREST, Kawaguchi, Saitama 3320012, Japan

来源：

JOURNAL OF CRYSTAL GROWTH | 2008年 / 310卷 / 11期

关键词：

crystal structure; X-ray diffraction; physical vapor deposition process; inorganic compound; phosphors;

D O I：

10.1016/j.jcrysgro.2008.01.046

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

This paper describes the preparation and characterization of fiber-textured SrAl2O4:Eu films on a quartz glass substrate using a homobuffer layer. The effect of the buffer layer on the crystallinity and adhesion was investigated by cross-section transmission electron microscopy and X-ray diffraction (XRD). The results show that the prepared film was not only well crystallized but also highly textured. The preferred orientation of this textured film was confirmed to be (0 3 1) by pole figure measurement. In addition, this film exhibits excellent optical transparency, with an average transmittance of more than 80% in the visible range. (c) 2008 Elsevier B.V. All rights reserved.

引用

页码：2885 / 2889

页数：5

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