High-Temperature Radiative Properties of an Yttria-Stabilized Hafnia Ceramic

被引：39

作者：

del Campo, Leire ^{[1
]}

Meneses, Domingos De Sousa ^{[1
,2
]}

Blin, Annie ^{[1
]}

Rousseau, Benoit ^{[1
]}

Veron, Emmanuel ^{[1
]}

Balat-Pichelin, Marianne ^{[3
]}

Echegut, Patrick ^{[1
]}

机构：

[1] CNRS, CEMHTI, UPR3079, F-45071 Orleans 2, France

[2] Univ Orleans, F-45067 Orleans 2, France

[3] CNRS, PROMES Lab Procedes Mat & Energie Solaire, F-66120 Font Romeu, France

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 2011年 / 94卷 / 06期

关键词：

OXIDE THIN-FILMS; OPTICAL-PROPERTIES; INFRARED-REFLECTIVITY;

D O I：

10.1111/j.1551-2916.2010.04336.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The normal spectral emittance of a partially yttria-stabilized hafnia (YSH) ceramic has been measured by infrared emittance spectroscopy in a spectral range going from 60 to 17 500 cm-1 (0.075-2.2 eV), and up to 2350 K. Using these experimental data, the temperature dependence of the absorption coefficient and the total emittance have been calculated. The physical mechanisms explaining the spectral features of the whole set of spectra are exposed qualitatively. The spectral weight of each contribution is then discussed for interpreting the influence of temperature on the total normal emittance in the range of temperatures (1200-2500 K) where YSH ceramics can be used for their refractory properties (thermal barrier coating, nuclear reactor, thermal protection systems, etc.).

引用

页码：1859 / 1864

页数：6

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