The effects of in-plane grain orientation and dc magnetic field on surface resistance of YBa2Cu3O7-δ films

The relationship between the surface resistance of YBa2Cu3O7-delta (YBCO) films and the in-plane orientation of crystal grains, and variation in the crystal axis of the films was, examined. It was clarified that the surface resistance and inplane orientation of crystal grains and fluctuation in the crystal axis of the films correlate to each other. It is important to obtain a thin film of perfect (100) plane orientation in order to decrease the surface resistance of a YBCO thin film, and it is also important that the variation in the crystal axis of the films is decreased. In this study the surface resistance of YBCO films in a dc magnetic field of similar to0.01 T has been measured. The value measured in the dc magnetic field was the same as that measured without the de magnetic field. The value of the surface resistance at 22 GHz and 30 K was approximately 400 mu Omega, which is a lower value than that reported by other authors. (C) 2001 Elsevier Science B.V. All rights reserved.