共 38 条
[1]
Birzer C, 2005, EL PACKAG TECH CONF, P255
[2]
The specific work of fracture in ball shear test and the integrity of solder balls
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
2006, 428 (1-2)
:67-72
[3]
The mechanics of the solder ball shear test and the effect of shear rate
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
2006, 417 (1-2)
:259-274
[4]
Effect of thermal aging on board level drop reliability for Pb-free BGA packages
[J].
54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS,
2004,
:1256-1262
[6]
The influence of test parameters and package design features on ball shear test requirements
[J].
TWENTY SIXTH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM, PROCEEDINGS,
2000,
:168-177
[8]
Huang XJ, 2001, ELEC COMP C, P1065
[9]
*JEDEC, 2006, JESD22B117A JEDEC
[10]
Development of lead (Pb)-free interconnection materials for microelectronics
[J].
METALS AND MATERIALS-KOREA,
1999, 5 (06)
:545-549