Neutron-induced electron radiography

被引：3

作者：

Pugliesi, R ^{[1
]}

Andrade, MLG ^{[1
]}

Pereira, MAS ^{[1
]}

Pugliesi, F ^{[1
]}

机构：

[1] CNEN SP, IPEN, BR-05508000 Sao Paulo, Brazil

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2005年 / 542卷 / 1-3期

关键词：

electron radiography; thin layers;

D O I：

10.1016/j.nima.2005.01.015

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In the present work, a new radiographic methodology which makes use of conventional X-ray films and low-energy electrons as penetrating radiation, to inspect low-thickness samples, has been investigated. The radiographic characteristics for the "electron beam-film" set, regarding its sensitivity to discern thickness changes of materials, as well as the spatial resolution achieved in the image have been determined. Some radiographs are presented and demonstrate the method's potential to inspect thin samples. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：81 / 86

页数：6

共 9 条

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[8] PUGLIESI R, INT AT EN AG IAEA VI
[9] WROBEL M, 1988, 88E12 GKSS

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