Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy

被引:12
作者
Srot, V. [1 ]
Watanabe, M. [2 ]
Scheu, C. [3 ]
van Aken, P. A. [1 ]
Salzberger, U. [1 ]
Luerssen, B. [4 ]
Janek, J. [4 ]
Ruehle, M. [1 ]
机构
[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[2] Lehigh Univ, Dept Mat Sci & Engn, Bethlehem, PA 18015 USA
[3] Univ Munich, Dept Chem, D-81377 Munich, Germany
[4] Univ Giessen, Inst Phys Chem, D-35392 Giessen, Germany
关键词
X-ray energy dispersive spectroscopy; Electron energy-loss spectroscopy; Electron energy-loss near edge structure; zeta-factor method; Spatial difference technique; Ab-initio multiple scattering calculations; ENERGY-LOSS SPECTROSCOPY; NEAR-EDGE STRUCTURE; METAL-CERAMIC INTERFACES; RESOLUTION; EELS; PROGRESS; OXIDES; SHIFTS; LEVEL; ELNES;
D O I
10.1016/j.ssi.2010.08.026
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Platinum/yttria stabilized zirconia (Pt/YSZ) interfaces with two different orientation relationships were characterized using advanced analytical transmission electron microscopy methods. Quantitative X-ray energy dispersive spectroscopy (XEDS) was performed by the recently developed zeta-factor method. Neither interdiffusion nor segregation was detected across the Pt/YSZ interfaces of both orientation conditions within the resolution limit of the technique. The interface specific components of the electron energy-loss near-edge structures (EWES) were extracted by employing the spatial difference technique. Features of the O-K EWES at the interface are distinctly different from that at bulk YSZ indicating Pt-O bonding. The experimentally observed changes in the O-K ELNES are in good agreement with the results of ab-initio full multiple scattering calculation, based on structure modeling at the interfaces. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:1616 / 1622
页数:7
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