Quantitative adhesion characterization of antireflective coatings in multijunction photovoltaics

被引:3
作者
Brock, Ryan [1 ]
Rewari, Raunaq [1 ]
Novoa, Fernando D. [1 ]
Hebert, Peter [2 ]
Ermer, James [2 ]
Miller, David C. [3 ]
Dauskardt, Reinhold H. [1 ]
机构
[1] Stanford Univ, Dept Mat Sci & Engn, 496 Lomita Mall,Durand Bldg,Rm 121, Stanford, CA 94305 USA
[2] Spectrolab Inc, Sylmar, CA 91342 USA
[3] Natl Renewable Energy Lab, Golden, CO 80401 USA
关键词
Multijunction; Photovoltaic; Antireflective; Delamination; Adhesion; Reliability; SOLAR-CELLS; TESTS;
D O I
10.1016/j.solmat.2016.04.027
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We discuss the development of a new composite dual cantilever beam (cDCB) thin-film adhesion testing method, which enables the quantitative measurement of adhesion on the thin and fragile substrates used in multijunction photovoltaics. In particular, we address the adhesion of several 2- and 3-layer antireflective coating systems on multijunction cells. By varying interface chemistry and morphology through processing, we demonstrate the marked effects on adhesion and help to develop an understanding of how high adhesion can be achieved, as adhesion values ranging from 0.5 J/m(2) to 10 J/m(2) were measured. Damp heat (85 degrees C/85% RH) was used to invoke degradation of interfacial adhesion. We demonstrate that even with germanium substrates that fracture relatively easily, quantitative measurements of adhesion can be made at high test yield. The cDCB test is discussed as an important new methodology, which can be broadly applied to any system that makes use of thin, brittle, or otherwise fragile substrates. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:78 / 83
页数:6
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