The status and future development of innovative optoelectronic devices based on III-nitrides on SiC and on III-antimonides

被引:15
作者
Stath, N
Härle, V
Wagner, J
机构
[1] OSRAM Opto Semicond, D-93049 Regensburg, Germany
[2] Fraunhofer Inst Appl Solid State Phys, D-79108 Freiburg, Germany
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2001年 / 80卷 / 1-3期
关键词
detector; GaN; laser; light-emitting diodes; SiC;
D O I
10.1016/S0921-5107(00)00607-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High-brightness nitride-based LEDs have been grown on SiC substrates. which offers many advantages in the production both from epitaxial, chip and device processing point of view. Optimized InGaN/GaN/GaAlN MQW structures and improved chip and package designs were developed, resulting in optical outputs that exceed 7 mW at 20 mA in a 5 mm axial lamp. InGaN oxide stripe lasers (450) mum x 3.5 mum) with an emission wavelength around 420 nm were fabricated showing threshold currents of 330 mA and turn-on voltages of about 21V operated under pulse current injections at room temperature, Strained layer GaInAsSb/AlGaAsSb quantum well lasers operating near room temperature with emission wavelengths up to 2.26 mum and a cw output of WO mW were demonstrated. Short-period InAs/GalnSb superlattices with different InAs layer. widths have been used for the fabrication of photodiodes, showing responsivity spectra with cut-off wavelengths of 3.5 and 10 mum, respectively. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:224 / 231
页数:8
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