Examining explosive residues on surfaces with terahertz technology

被引:0
|
作者
Dikmelik, Yamac [1 ]
Fitch, Michael J. [2 ]
Leahy-Hoppa, Megan R. [2 ]
Osiander, Robert [2 ]
机构
[1] Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA
[2] Johns Hopkins Univ, Appl Phys Lab, Laurel, MD 20723 USA
来源
TERAHERTZ FOR MILITARY AND SECURITY APPLICATIONS V | 2007年 / 6549卷
关键词
terahertz; spectroscopy; explosives;
D O I
10.1117/12.719816
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is well-known that many explosives have characteristic terahertz (THz) absorption features, and that THz waves can penetrate many dielectric materials. However security applications generally prohibit using THz technology for transmission measurements, either because of standoff distances, thick targets, or opaque targets (metals). As a result, we focus our attention on THz reflection spectroscopy. We have measured the THz reflectivity signature of RDX residues on smooth metal surfaces that contain about 0.4 mg of RDX. We discuss our efforts in detecting trace explosives in reflection as well as our recent results including THz spectroscopy of four explosives from I to 6 THZ, and measurement of the absolute absorption cross-section of explosives.
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页数:7
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