Loss Dependence on Geometry and Applied Power in Superconducting Coplanar Resonators

被引:53
作者
Khalil, Moe S. [1 ,2 ]
Wellstood, F. C. [3 ]
Osborn, Kevin D. [1 ]
机构
[1] Lab Phys Sci, College Pk, MD 20740 USA
[2] Univ Maryland, Ctr Nanophys & Adv Mat, Dept Phys, College Pk, MD 20740 USA
[3] Univ Maryland, Dept Phys, Ctr Nanophys & Adv Mat, College Pk, MD 20740 USA
关键词
Dielectric loss; superconducting microwave resonators; superconducting quantum computing; two-level systems;
D O I
10.1109/TASC.2010.2090330
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The loss in superconducting microwave resonators at low-photon numbers and low temperatures is not well understood but has implications for achievable coherence times in superconducting qubits. We have fabricated single-layer resonators with a high quality factor by patterning a superconducting aluminum film on a sapphire substrate. Four resonator geometries were studied with resonant frequencies ranging from 5 to 7 GHz: a quasi-lumped element resonator, a coplanar strip waveguide resonator, and two hybrid designs that contain both a coplanar strip and a quasi-lumped element. Transmitted power measurements were taken at 30 mK as a function of frequency and probe power. We find that the resonator loss, expressed as the inverse of the internal quality factor, decreases slowly over four decades of photon number in a manner not merely explained by loss from a conventional uniform spatial distribution of two-level systems in an oxide layer on the superconducting surfaces of the resonator.
引用
收藏
页码:879 / 882
页数:4
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