Electron differaction patterns with curved Kikuchi lines

被引：2

作者：

Karakhanyan, R. K. ^{[1
]}

Karakhanyan, K. R. ^{[1
]}

机构：

[1] Yerevan State Univ, Yerevan 0025, Armenia

来源：

CRYSTALLOGRAPHY REPORTS | 2007年 / 52卷 / 05期

关键词：

Crystal structure - Electron diffraction - Transmission electron microscopy;

D O I：

10.1134/S1063774507050021

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Curved Kikuchi lines have been observed in electron diffraction patterns obtained for silicon by transmission electron microscopy. It is found that the curvature of Kikuchi lines is related to the shift of point reflections from their normal positions. The formation of curved Kikuchi lines stems from the local structural defects in the crystals under study.

引用

页码：768 / 769

页数：2