InGaN/GaN light emitting diodes on nanoscale silicon on insulator

被引:29
作者
Tripathy, S.
Lin, V. K. X.
Teo, S. L.
Dadgar, A.
Diez, A.
Blaesing, J.
Krost, A.
机构
[1] Inst Mat Res & Engn, Singapore 117602, Singapore
[2] Otto Von Guericke Univ, D-39016 Magdeburg, Germany
[3] AZZURO Semicond AG, Magdeburg, Germany
关键词
D O I
10.1063/1.2814062
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors report on the fabrication of InGaN/GaN-based light emitting diodes (LEDs) on nanoscale silicon-on-insulator (SOI) substrates. The LED structures are grown on (111)-oriented 45 nm thick SOI overlayer by metal organic chemical vapor deposition. Square-shaped mesa patterns are created by standard LED processing steps including multiple-mask photolithography, inductive coupled plasma etching, and contact metallization. Due to the high reflective Si/SiO(2) beneath AlN buffer and high refractive contrasts at the interfaces, the authors observed multiple interference peaks from LEDs on SOI and such effect resulted in an increased integrated electroluminescence intensity when compared to LED structures fabricated on bulk Si(111).
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页数:3
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