Quality factor for localized defect modes in a photonic crystal slab upon a low-index dielectric substrate

被引：24
作者：
Miyai, E [1 ]
Sakoda, K [1 ]
机构：
[1] Hokkaido Univ, Res Inst Elect Sci, Sapporo, Hokkaido 0600812, Japan
来源：
OPTICS LETTERS | 2001年 / 26卷 / 10期
关键词：
D O I：
10.1364/OL.26.000740
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Localized defect modes in a two-dimensional photonic crystal slab upon a SiO2 substrate have been analyzed by a numerical simulation of dipole radiation based on the finite-difference time-domain method. A degenerate pair of the defect mode of E-1 spatial symmetry was found in a pseudogap in the spectrum of dipole radiation. We achieved a quality factor as large as 800 by optimizing the sample geometry. (C) 2001 Optical Society of America.
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收藏
页码：740 / 742
页数：3
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