Quality factor for localized defect modes in a photonic crystal slab upon a low-index dielectric substrate

被引：24

作者：

Miyai, E ^{[1
]}

Sakoda, K ^{[1
]}

机构：

[1] Hokkaido Univ, Res Inst Elect Sci, Sapporo, Hokkaido 0600812, Japan

来源：

OPTICS LETTERS | 2001年 / 26卷 / 10期

关键词：

D O I：

10.1364/OL.26.000740

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Localized defect modes in a two-dimensional photonic crystal slab upon a SiO2 substrate have been analyzed by a numerical simulation of dipole radiation based on the finite-difference time-domain method. A degenerate pair of the defect mode of E-1 spatial symmetry was found in a pseudogap in the spectrum of dipole radiation. We achieved a quality factor as large as 800 by optimizing the sample geometry. (C) 2001 Optical Society of America.

引用

页码：740 / 742

页数：3

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