Comment on tilt of atomic force microscope cantilevers: effect on spring constant and adhesion measurements

The effects of cantilever tilt and probe geometry on cantilever deflection, and their predicted consequences for AFM force measurements were investigated. It was shown that cantilever tilt and probe geometry also affect the calibration of the detector system. The tilt also has consequences for spring constant calibration. It should be emphasized that even the modified corrections reported assume a cantilever of uniform cross section. It is stated that for other geometries, such as more common triangular cantilevers, the correction factors would differ.