Visible and near-infrared wavelength-selective dielectric reflectors for light management applications

被引：11

作者：

Dubey, R. S. ^{[1
]}

Ganesan, V. ^{[2
]}

机构：

[1] Swarnandhra Coll Engn & Technol, Dept Nanotechnol, Adv Res Lab Nanomat & Devices, Narsapur, AP, India

[2] Indore Ctr, UGC DAE Consortium Sci Res, Univ Campus,Khandwa Rd, Indore, MP, India

来源：

SUPERLATTICES AND MICROSTRUCTURES | 2018年 / 122卷

关键词：

Bragg reflectors; Multilayers structure; TiO2/SiO2; stacks; Reflectance; Periodic layers; THIN-FILM STACKS;

D O I：

10.1016/j.spmi.2018.08.005

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Wavelength selective reflectors have been widely used in lightemitting diodes, microcavities, waveguides, solar cells and many more. This paper presents the preparation and study of TiO2/SiO2 distributed Bragg reflectors. These multilayer structures were prepared by adopting an easy and cost-effective sol-gel spin coating approach. The prepared samples were examined using field-emission scanning microscopy (FESEM), energy dispersive x-ray (EDS) spectroscopy, ultraviolet-visible (UV-vis) spectrophotometry and Fourier transform infrared (FTIR) spectroscopy. The top surface FESEM studies showed the uniform and homogeneous films while cross-sectional analyses evidenced the periodic structures of TiO2 and SiO2 films. The elemental peaks of Ti, O, and Si were confirmed by EDS investigation. FTIR investigation endorsed the stretching vibration peaks of Ti-O-Ti and Si-O-Si bonds. The reflectance of all samples was studied in accordance with numbers of TiO2/SiO2 stacks and the solution aging. However, the dominant shift of the reflection band from visible to near-infrared wavelength was observed in accordance with the solution aging from 20 to 40 h.

引用

页码：228 / 234

页数：7

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