Correlation between Desorption Force Measured by Atomic Force Microscopy and Adsorption Free Energy Measured by Surface Plasmon Resonance Spectroscopy for Peptide-Surface Interactions

被引:41
|
作者
Wei, Yang [1 ]
Latour, Robert A. [1 ]
机构
[1] Clemson Univ, Dept Bioengn, Rhodes Engn Res Ctr 501, Clemson, SC 29634 USA
关键词
SELF-ASSEMBLED MONOLAYERS; PROTEIN-LIGAND INTERACTION; SINGLE-MOLECULE; HYDROPHOBIC ADSORBENTS; POLYMER-CHAINS; AFM; ADHESION; THERMODYNAMICS; WETTABILITY; ATTACHMENT;
D O I
10.1021/la103685d
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Surface plasmon resonance (SPR) spectroscopy is a useful technique for thermodynamically characterizing peptide-surface interactions; however, its usefulness is limited to the types of surfaces that can readily be formed as thin layers on the nanometer scale on metallic biosensor substrates. Atomic force microscopy (AFM), on the other hand, can be used with any microscopically flat surface, thus making it more versatile for studying peptide-surface interactions. AFM, however, has the drawback of data interpretation due to questions regarding peptide-to-probe tip density. This problem could be overcome if results from a standardized AFM method could be correlated with SPR results for a similar set of peptide-surface interactions so that AFM studies using the standardized method could be extended to characterize peptide-surface interactions for surfaces that are not amenable for characterization by SPR. In this article, we present the development and application of an AFM method to measure adsorption forces for host guest peptides sequence on surfaces consisting of alkanethiol self-assembled monolayers (SAMs) with different functionality. The results from these studies show that a linear correlation exists between these data and the adsorption free energy (Delta G(ads)(o)) values associated with a similar set of peptide-surface systems available from SPR measurements. These methods will be extremely useful to characterize thermodynamically the adsorption behavior for peptides on a much broader range of surfaces than can be used with SPR to provide information related to understanding protein adsorption behavior to these surfaces and to provide an experimental database that can be used for the evaluation, modification, and validation of force field parameters that are needed to represent protein adsorption behavior accurately for molecular simulations.
引用
收藏
页码:18852 / 18861
页数:10
相关论文
共 26 条
  • [21] Effects of Humidity and Sample Surface Free Energy on AFM Probe-Sample Interactions and Lateral Force Microscopy Image Contrast
    Chen, Lijiang
    Gu, Xiaohong
    Fasolka, Michael J.
    Martin, Jonathan W.
    Nguyen, Tinh
    LANGMUIR, 2009, 25 (06) : 3494 - 3503
  • [22] Simultaneous Surface-Enhanced Raman Spectroscopy (SERS) and Atomic Force Microscopy (AFM) for Label-Free Physicochemical Analysis of Lipid Bilayers
    Sweetenham, Claire S.
    Larraona-Puy, Marta
    Notingher, Ioan
    APPLIED SPECTROSCOPY, 2011, 65 (12) : 1387 - 1392
  • [23] Specific surface area of clay minerals: Comparison between atomic force microscopy measurements and bulk-gas (N2) and -liquid (EGME) adsorption methods
    Macht, Felix
    Eusterhues, Karin
    Pronk, Geertje Johanna
    Totsche, Kai Uwe
    APPLIED CLAY SCIENCE, 2011, 53 (01) : 20 - 26
  • [24] Probing molecular interactions between humic acid and surface-grafted polyacrylamide using quartz crystal microbalance with dissipation and atomic force microscopy: implications for environmental remediation
    Maan, Omar
    Huang, Jun
    Zeng, Hongbo
    Lu, Qingye
    ENVIRONMENTAL CHEMISTRY, 2018, 15 (06) : 336 - 350
  • [25] Binding kinetics of mutant p53R175H with wild type p53 and p63: A Surface Plasmon Resonance and Atomic Force Spectroscopy study
    Moscetti, Ilaria
    Bizzarri, Anna Rita
    Cannistraro, Salvatore
    BIOPHYSICAL CHEMISTRY, 2017, 228 : 55 - 61
  • [26] Preparation of an ultraclean and atomically controlled hydrogen-terminated si(111)-(1x1) surface revealed by high resolution electron energy loss spectroscopy, atomic force microscopy, and scanning Tunneling microscopy:: Aqueous NH4F etching process of si(111)
    Kato, Hiroki
    Taoka, Takumi
    Nishikata, Susumu
    Sazaki, Gen
    Yamada, Taro
    Czajka, Ryszard
    Wawro, Andrzej
    Nakajima, Kazuo
    Kasuya, Atsuo
    Suto, Shozo
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (9A): : 5701 - 5705