Temperature and concentration dependent electrical resistivity of Ho1-xTixCo2-hydrogen system

被引：2

作者：

Srinivas, G.

Sankaranarayanan, V.

Ramaprabhu, S. ^{[1
]}

机构：

[1] Indian Inst Technol, Low Temp Lab, Dept Phys, Madras 600036, Tamil Nadu, India

[2] Indian Inst Technol, Alternat Energy Technol Lab, Dept Phys, Madras 600036, Tamil Nadu, India

来源：

SOLID STATE SCIENCES | 2007年 / 9卷 / 10期

关键词：

RCo2; laves phase; Hydrides; electrical resistivity; XRD;

D O I：

10.1016/j.solidstatesciences.2007.07.032

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

The structure and electrical resistivity of Ho1-xTixCo2-hydrides (x = 0. 1-0.6) have been determined through the powder X-ray diffraction (XRD) and temperature dependence of electrical resistivity (rho(T)) at different hydrogen concentrations. The variations in the lattice parameters in different phase regions and the lattice expansion with respect to the hydrogen concentration have been studied. The temperature dependent electrical resistivity of hydrides has been discussed based on the conduction electron scattering and spin fluctuation scattering mechanisms. The changes in rho(T) upon Ti substitution and increasing concentration of hydrogen have been discussed and the results have been correlated with their structural properties. (c) 2007 Published by Elsevier Masson SAS.

引用

页码：973 / 979

页数：7

共 43 条

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