High detection sensitivity of ultraviolet 4H-SiC avalanche photodiodes

被引:67
作者
Bai, Xiaogang [1 ]
Guo, Xiangyi [1 ]
Mcintosh, Dion C. [1 ]
Liu, Han-Din [1 ]
Campbell, Joe C. [1 ]
机构
[1] Univ Virginia, Sch Engn & Appl Sci, Dept Elect & Comp Engn, Charlottesville, VA 22904 USA
关键词
avalanche photodiodes (APDs); linear mode; silicon; carbide (SiC); ultraviolet (UV);
D O I
10.1109/JQE.2007.905031
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report 4H-SiC p-i-n avalanche photodiodes (APDs) with very low dark current. When biased for a photocurrent gain M of 1000 a 100-mu m-diameter device exhibits dark current of 5 pA (63 nA/cm(2))corresponding to primary multiplied dark current of 5 fA (63 pA/cm(2)). The peak responsivity at unity gain is 93 mA/W (external quantum efficiency = 41%) at lambda =280 nm. The excess noise factor corresponds to kappa = 0.1. Detection of several tens of femtowatts of ultraviolet light is reported.
引用
收藏
页码:1159 / 1162
页数:4
相关论文
共 17 条
  • [1] GaN avalanche photodiodes
    Carrano, JC
    Lambert, DJH
    Eiting, CJ
    Collins, CJ
    Li, T
    Wang, S
    Yang, B
    Beck, AL
    Dupuis, RD
    Campbell, JC
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (07) : 924 - 926
  • [2] Improved solar-blind detectivity using an AlxGa1-xN heterojunction p-i-n photodiode
    Collins, CJ
    Chowdhury, U
    Wong, MM
    Yang, B
    Beck, AL
    Dupuis, RD
    Campbell, JC
    [J]. APPLIED PHYSICS LETTERS, 2002, 80 (20) : 3754 - 3756
  • [3] GUO X, 2003, ELECTRON LETT, V39, P1673
  • [4] Performance of low-dark-current 4H-SiC avalanche photodiodes with thin multiplication layer
    Guo, Xiangyi
    Beck, Ariane L.
    Huang, Zhihong
    Duan, Ning
    Campbell, Joe C.
    Emerson, David
    Sumakeris, Joseph J.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2006, 53 (09) : 2259 - 2265
  • [5] Study of reverse dark current in 4H-SiC avalanche photodiodes
    Guo, XY
    Beck, AL
    Li, XW
    Campbell, JC
    Emerson, D
    Sumakeris, J
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2005, 41 (04) : 562 - 567
  • [6] Demonstration of ultraviolet separate absorption and multiplication 4H-SiC avalanche photodiodes
    Guo, XY
    Rowland, LB
    Dunne, GT
    Fronheiser, JA
    Sandvik, PM
    Beck, AL
    Campbell, JC
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 2006, 18 (1-4) : 136 - 138
  • [7] Spatial nonuniformity of 4H-SiC avalanche photodiodes at high gain
    Guo, XY
    Beck, AL
    Campbell, JC
    Emerson, D
    Sumakeris, J
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2005, 41 (10) : 1213 - 1216
  • [8] Ionization rates and critical fields in 4H silicon carbide
    Konstantinov, AO
    Wahab, Q
    Nordell, N
    Lindefelt, U
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (01) : 90 - 92
  • [9] GaN avalanche photodiodes grown by hydride vapor-phase epitaxy
    McIntosh, KA
    Molnar, RJ
    Mahoney, LJ
    Lightfoot, A
    Geis, MW
    Molvar, KM
    Melngailis, I
    Aggarwal, RL
    Goodhue, WD
    Choi, SS
    Spears, DL
    Verghese, S
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (22) : 3485 - 3487
  • [10] Multiplication and excess noise characteristics of thin 4H-SiC UV avalanche photodiodes
    Ng, BK
    Yan, F
    David, JPR
    Tozer, RC
    Rees, GJ
    Qin, C
    Zhao, JH
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 2002, 14 (09) : 1342 - 1344