Robustness against SEU of an artificial neural network space application

被引：8
作者：
Assoum, A
Radi, NE
Velazco, R
Elie, F
Ecoffet, R
机构：
[1] CNRS,LPCE,F-45071 ORLEANS,FRANCE
[2] CTR NATL ETUD SPATIALES,F-31055 TOULOUSE,FRANCE
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1996年 / 43卷 / 03期
关键词：
D O I：
10.1109/23.510742
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We study the sensitivity of Artificial Neural Networks (ANN) to Single Event Upsets (SEU). A neural network designed to detect electronic and protonic whistlers has been implemented using a dedicated VLSI circuit: the LNeuro neural processor. Results of both SEU software simulations and heavy ion tests point out the fault tolerance properties of ANN hardware implementations.
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收藏
页码：973 / 978
页数：6
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