Localized electronic excitations in NiO studied with resonant inelastic X-ray scattering at the Ni M threshold:: Evidence of spin flip -: art. no. 197402

被引：68

作者：

Chiuzbaian, SG ^{[1
]}

Ghiringhelli, G

Dallera, C

Grioni, M

Amann, P

Wang, X

Braicovich, L

Patthey, L

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Politecn Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy

[3] Ecole Polytech Fed Lausanne, IPN, CH-1015 Lausanne, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2005年 / 95卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.95.197402

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M-2,M-3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 +/- 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.

引用

页数：4

共 27 条

[1]

[Anonymous], D D EXCITATIONS TRAN

[2]

BROWN B, 1971, SOLID STATE COMMUN, V9, P487

[3] Low-energy d-d excitations in MnO studied by resonant x-ray fluorescence spectroscopy [J].