Scanning three-dimensional X-ray diffraction microscopy using a high-energy microbeam

被引：6

作者：

Hayashi, Y. ^{[1
]}

Hirose, Y. ^{[1
]}

Seno, Y. ^{[1
]}

机构：

[1] Toyota Cent Res & Dev Labs Inc, Toyota Cent R&D, 41-1 Nagakute, Nagakute, Aichi 4801192, Japan

来源：

PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2015) | 2016年 / 1741卷

关键词：

DEFORMATION;

D O I：

10.1063/1.4952944

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A scanning three-dimensional X-ray diffraction (3DXRD) microscope apparatus with a high-energy microbeam was installed at the BL33XU Toyota beamline at SPring-8. The size of the 50keV beam focused using Kirkpatrick-Baez mirrors was 1.3 mu m wide and 1.6 mu m high in full width at half maximum. The scanning 3DXRD method was tested for a cold-rolled carbon steel sheet sample. A three-dimensional orientation map with 37(3) voxels was obtained.

引用

页数：4

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