Angle-resolved !de Haas-van Alphen study of SrRuO3 -: art. no. 024415

被引:15
作者
Alexander, CS [1 ]
McCall, S
Schlottmann, P
Crow, JE
Cao, G
机构
[1] Florida State Univ, Natl High Magnet Field Lab, Tallahassee, FL 32310 USA
[2] Univ Kentucky, Dept Phys & Astron, Lexington, KY 40506 USA
关键词
D O I
10.1103/PhysRevB.72.024415
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The results of angle-resolved de Haas-van Alphen oscillations in SrRuO3 single crystals are reported. At least six fundamental frequencies of oscillation are detected between 100 and 11 000 T. The effective mass of the charge carriers is measured for each orbit and ranges from 4.1 to 6.9 m(e). The mean free path length of the charge carriers is between 640 and 5500 A or roughly 100-1000 times the unit cell dimensions. The measured frequencies are compared to the Fermi surface calculated by Santi and Jarlborg.
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页数:6
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