Experimental and analytical study of saturation current density of laser-doped phosphorus emitters for silicon solar cells

被引:24
作者
Paviet-Salomon, B. [1 ]
Gall, S. [1 ]
Monna, R. [1 ]
Manuel, S. [1 ]
Slaoui, A. [2 ]
机构
[1] CEA, LITEN, INES, F-73377 Le Bourget Du Lac, France
[2] UdS, CNRS, UMR 7163, InESS, F-67037 Strasbourg, France
关键词
Silicon; Laser doping; Emitter saturation current density; PC1D; SURFACE RECOMBINATION VELOCITY; MACROSCOPIC THEORY; DIFFUSION;
D O I
10.1016/j.solmat.2011.03.001
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Heavily doped emitters with low saturation current density are of particular interest for selective emitter solar cells. These emitters can be obtained by laser doping through the phosphosilicate glass layer formed after thermal diffusion from POCl(3) gas. The experimental results show that in contrast to purely POCl(3) furnace-diffused emitters, the saturation current density of laser-doped emitters does not increase linearly as sheet resistance decreases, but rather features two distinct regimes. In one of these regimes, the saturation current density is found to decrease as the sheet resistance decreases, reaching values lower than those of furnace emitters. This peculiar behaviour was explained by both qualitative analysis and numerical simulations. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:2536 / 2539
页数:4
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