The formation of an inhomogeneous distribution of oxygen in CZ-Si crystal - An investigation with quantum reaction-diffusion equation

被引:0
作者
Xu, LB
机构
[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
[2] Zhejiang Univ, Dept Phys, Hangzhou 310027, Peoples R China
[3] Zhejiang Univ, Zhejiang Inst Modern Phys, Hangzhou 310027, Peoples R China
关键词
impurity concentration; silicon crystal growth; interface;
D O I
暂无
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
With a statistical partition function model for oxygen atoms at the interface between the silicon crystal and melt during Czochralski silicon (CZ-Si) crystallisation, we research a dynamic reaction-diffusion process to analyse the nonequilibrium dynamical distribution of oxygen atoms in the silicon medium. The calculated results from the quantum reaction-diffusion equation (QRDE) shows that the striations of oxygen concentration distribution observed in the experiment can be explained by such nonequilibrium dynamical reaction-diffusion processes. These results are suitable for understanding how the striations are related to the physical conditions of a practical crystal growth process. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:541 / 551
页数:11
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