Simulating Charge Collection Efficiency in a CMOS Pixel Array for X-ray detection

被引：1
作者：
Leonel Corzi, Damian [1 ]
Lipovetzky, Jose
Perez, Martin
Gabriela Gutierrez, Silvina
Sofo Haro, Miguel
Alcalde Bessia, Fabricio
Gomez Berisso, Mariano
机构：
[1] Univ Nacl Cuyo, Ctr Atom Bariloche, Consejo Nacl Invest Cient & Tecn CONICET, Av E Bustillo 9500,R8402AGP, San Carlos De Bariloche, Rio Negro, Argentina
来源：
2022 ARGENTINE CONFERENCE ON ELECTRONICS (CAE) | 2022年
关键词：
CMOS image sensor; ionizing radiation; X-rays; spectroscopy; THE-SHELF CMOS;
D O I：
10.1109/CAE54497.2022.9762498
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
CMOS image sensors can be used for high-resolution X-ray spectroscopy by considering only photons detected in individual pixels. This work studies how the charge is collected by a single pixel when an X-ray photon is absorbed in different regions of a pixel array of an image sensor.
引用
收藏
页码：26 / 30
页数：5
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