Development of an ASIC for multi-readout X-ray CCDs

被引：0

作者：

Matsuura, Daisuke ^{[1
,2
]}

Nakajima, Hiroshi ^{[1
,2
]}

Miyata, Emi ^{[1
,2
]}

Tsunemi, Hiroshi ^{[1
]}

Doty, John P. ^{[3
]}

Ikeda, Hirokazu ^{[4
]}

机构：

[1] Osaka Univ, Grad Sch Sci, Dept Earth & Space Sci, 1-1 Machikaneyama, Osaka 5600043, Japan

[2] Mitsubishi Heavy Ind Co Ltd, Dept Space & Integrated Def Syst, Aichi, Japan

[3] Noqsi Aerosp Ltd, Pine, CO 80470 USA

[4] Japan Aerosp Explorat Agcy, Inst Space & Astronaut Sci, Kanagawa, Japan

来源：

2007 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-11 | 2007年

关键词：

charge-coupled device(CCD); X-ray detector; imaging detector; ASIC;

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray CCDs have poor timing resolution of several seconds. Since the pixel rate is limited to keep readout noise low, we develop an application specific integrated circuits (ASIC) for multi-readout of X-ray CCDs in order to make the readout circuits small and the power consumption low. Our ASIC with the size of 3 mm x 3 mm has four channels, each channel converts the CCD outputs to 12 bits data employing a delta-sigma(Delta Sigma) digitization. The fabrication process is a 0.35 mu m CMOS technology provided by Taiwan Semiconductor Manufacturing Company (TSMC). The equivalent input noise is about 34 mu V and the power consumption is about 70mW per chip at the pixel rate of 44 kHz. When we use the X-ray CCD whose sensitivity is 3.5 mu V/e(-), the equivalent noise charge is 10 e(-) and the energy resolution is 164 eV(FWHM) at 5.9 keV.

引用

页码：1073 / 1077

页数：5

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