Dependence of minimum operating Voltage(VDDmin) on block size of 90-nm CMOS ring oscillators and its implications in low power DIM

被引：14

作者：

Niiyama, Taro ^{[1
]}

Zhe, Piao ^{[1
]}

Ishida, Koichi ^{[1
]}

Murakata, Masami ^{[2
]}

Takamiya, Makoto ^{[1
]}

Sakurai, Takayasu ^{[1
]}

机构：

[1] Univ Tokyo, Tokyo 1138654, Japan

[2] STARC, Yokohama, Kanagawa, Japan

来源：

ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN | 2008年

关键词：

D O I：

10.1109/ISQED.2008.59

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：133 / +

页数：2

共 6 条

[1] Ultra-dynamic voltage scaling (UDVS) using sub-threshold operation and local voltage dithering [J].

Calhoun, BH ;

Chandrakasan, AP .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2006, 41 (01) :238-245

[2] Performance and variability optimization strategies in a Sub-200mV, 3.5pJ/inst, 11 nW subthreshold processor [J].

Hanson, Scott ;

Zhai, Bo ;

Seok, Mingoo ;

Cline, Brian ;

Zhou, Kevin ;

Singhal, Meghna ;

Minuth, Michael ;

Olson, Javin ;

Nazhandali, Leyla ;

Austin, Todd .

2007 Symposium on VLSI Circuits, Digest of Technical Papers, 2007, :152-153

[3] A 85mV 40nW process-to le rant subthreshold WFIR filter in 130nm technology [J].

Hwang, Myeong-Eun ;

Raychowdhury, Arijit ;

Kim, Keejong ;

Roy, Kaushik .

2007 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, 2007, :154-155

[4]

Levacq D, 2007, IEEE CUST INTEGR CIR, P257

[5]

Masuda H, 2005, IEEE CUST INTEGR CIR, P593

[6] Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage [J].

Tschanz, JW ;

Kao, JT ;

Narendra, SG ;

Nair, R ;

Antoniadis, DA ;

Chandrakasan, AP ;

De, V .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2002, 37 (11) :1396-1402

← 1 →