Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer

被引:3
作者
Lu, Wenchao [1 ]
Duan, Jiandong [1 ]
Cheng, Lin [2 ]
Lu, Jiangping [2 ]
Du, Xiaotong [1 ]
机构
[1] Xian Univ Technol, Sch Elect Engn, Xian 710048, Peoples R China
[2] State Grid Shaanxi Elect Power Co, Elect Power Res Inst, Xian 710100, Peoples R China
基金
中国国家自然科学基金;
关键词
primary and secondary integration; intelligent switch; electromagnetic interference; ball gap; electronic transformer;
D O I
10.3390/s21237800
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The development of the smart grid requires the distribution switch to not be limited to the original breaking function. More functional requirements lead to more complex switch structures, especially the intelligent processing unit on the secondary side. A technology called primary and secondary integration optimizes the structure of the switch, which greatly increases the intelligence level of the switch, but also has disadvantages. The secondary intelligent unit is arranged close to the primary high-voltage electromagnetic environment, and the distribution switch is prone to failure due to electromagnetic interference. In order to explore the influence of electromagnetic interference on it, a transient electromagnetic interference simulation test platform was built for a 10 kV intelligent distribution switch based on the principle of spherical gap arc discharge, and the interference signal of the intelligent distribution switch was measured; the law of the spatial magnetic field near the electronic transformer is mainly studied in this paper. The shielding effectiveness of the distribution terminal of the switch was analyzed, and the interference of the power line of the sensor merging unit circuit board was calculated. The results show that the electronic transformer may have serious faults under continuous strong transient electromagnetic interference. The electromagnetic transient simulation test system studied in this paper can evaluate the anti strong electromagnetic interference ability of the electronic transformer.
引用
收藏
页数:14
相关论文
共 25 条
[11]  
[黎鹏 Li Peng], 2015, [电网技术, Power System Technology], V39, P110
[12]   电子式互感器电磁兼容性能研究现状分析 [J].
李振华 ;
于洁 ;
李振兴 ;
徐艳春 .
高压电器, 2017, 53 (04) :220-226
[13]  
Liu YY, 2012, 2012 6TH ASIA-PACIFIC CONFERENCE ON ENVIRONMENTAL ELECTROMAGNETICS (CEEM' 2012), P381, DOI 10.1109/CEEM.2012.6410648
[14]   Effects of Multiple Influence Quantities on Rogowski-Coil-Type Current Transformers [J].
Mingotti, A. ;
Peretto, L. ;
Tinarelli, R. .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 69 (07) :4827-4834
[15]   Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers [J].
Mingotti, Alessandro ;
Peretto, Lorenzo ;
Tinarelli, Roberto .
SENSORS, 2020, 20 (14) :1-13
[16]   Electronic Voltage and Current Transformers Testing Device [J].
Pan, Feng ;
Chen, Ruimin ;
Xiao, Yong ;
Sun, Weiming .
SENSORS, 2012, 12 (01) :1042-1051
[17]   Measurement and Evaluation Techniques to Estimate the Degradation Produced by the Radiated Transients Interference to the GSM System [J].
Pous, Marc ;
Azpurua, Marco A. ;
Silva, Ferran .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2015, 57 (06) :1382-1390
[18]  
Sen L.S., 2019, HIGH VOLT ENG, V45, P2818
[19]  
[童悦 Tong Yue], 2013, [高电压技术, High Voltage Engineering], V39, P2829
[20]  
Wang W., 2018, P 2018 2 IEEE C ENER, P1