Apertureless near-field/far-field CW two-photon microscope for biological and material imaging and spectroscopic applications

被引:5
作者
Nowak, Derek B. [1 ]
Lawrence, A. J. [1 ]
Sanchez, Erik J. [1 ]
机构
[1] Portland State Univ, Dept Phys, Portland, OR 97207 USA
基金
美国国家科学基金会;
关键词
QUARTZ TUNING FORK; FOCUSED ION-BEAMS; FLUORESCENCE MICROSCOPY; OPTICAL MICROSCOPY; METAL TIPS; PROBE TIP; RESOLUTION; EXCITATION; ENHANCEMENT; DISTANCE;
D O I
10.1364/AO.49.006766
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present the development of a versatile spectroscopic imaging tool to allow for imaging with single-molecule sensitivity and high spatial resolution. The microscope allows for near-field and subdiffraction-limited far-field imaging by integrating a shear-force microscope on top of a custom inverted microscope design. The instrument has the ability to image in ambient conditions with optical resolutions on the order of tens of nanometers in the near field. A single low-cost computer controls the microscope with a field programmable gate array data acquisition card. High spatial resolution imaging is achieved with an inexpensive CW multiphoton excitation source, using an apertureless probe and simplified optical pathways. The high-resolution, combined with high collection efficiency and single-molecule sensitive optical capabilities of the microscope, are demonstrated with a low-cost CW laser source as well as a mode-locked laser source. (C) 2010 Optical Society of America
引用
收藏
页码:6766 / 6771
页数:6
相关论文
共 40 条
  • [1] BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE
    BETZIG, E
    TRAUTMAN, JK
    HARRIS, TD
    WEINER, JS
    KOSTELAK, RL
    [J]. SCIENCE, 1991, 251 (5000) : 1468 - 1470
  • [2] Imaging intracellular fluorescent proteins at nanometer resolution
    Betzig, Eric
    Patterson, George H.
    Sougrat, Rachid
    Lindwasser, O. Wolf
    Olenych, Scott
    Bonifacino, Juan S.
    Davidson, Michael W.
    Lippincott-Schwartz, Jennifer
    Hess, Harald F.
    [J]. SCIENCE, 2006, 313 (5793) : 1642 - 1645
  • [3] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [4] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
    BINNING, G
    ROHRER, H
    GERBER, C
    WEIBEL, E
    [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61
  • [5] 2-PHOTON LASER SCANNING FLUORESCENCE MICROSCOPY
    DENK, W
    STRICKLER, JH
    WEBB, WW
    [J]. SCIENCE, 1990, 248 (4951) : 73 - 76
  • [6] TUNNELING MICROSCOPE FOR OPERATION IN AIR OR FLUIDS
    DRAKE, B
    SONNENFELD, R
    SCHNEIR, J
    HANSMA, PK
    SLOUGH, G
    COLEMAN, RV
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (03) : 441 - 445
  • [7] Focal spots of size λ/23 open up far-field florescence microscopy at 33 nm axial resolution -: art. no. 163901
    Dyba, M
    Hell, SW
    [J]. PHYSICAL REVIEW LETTERS, 2002, 88 (16) : 4 - 163901
  • [8] Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
    Edwards, H
    Taylor, L
    Duncan, W
    Melmed, AJ
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 82 (03) : 980 - 984
  • [9] Tip-enhanced fluorescence microscopy at 10 nanometer resolution
    Gerton, JM
    Wade, LA
    Lessard, GA
    Ma, Z
    Quake, SR
    [J]. PHYSICAL REVIEW LETTERS, 2004, 93 (18) : 180801 - 1
  • [10] HIGH-SPEED SCANNING TUNNELING MICROSCOPES
    GREGORY, S
    ROGERS, CT
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 390 - 392