Nanometer-scale solvent-assisted modification of polymer surfaces using the atomic force microscope

被引:26
作者
Leach, RN
Stevens, F
Seiler, C
Langford, SC
Dickinson, JT [1 ]
机构
[1] Washington State Univ, Dept Phys, Pullman, WA 99164 USA
[2] FHOOW, Emden, Germany
关键词
D O I
10.1021/la035289n
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We describe the response of poly(methyl methacrylate) surfaces to localized mechanical stimulation by the tip of an atomic force microscope (AFM) in water, methanol, ethanol, and aqueous alcohol solutions. Simply pressing the AFM tip into the surface with no horizontal motion fails to produce visible features in subsequent low contact force images. A single small-area (40 x 40 nm(2)) high contact force scan has little effect in air but in water or in alcohol-water mixtures produces soft bumps (local volume increase) adjacent to the scanned area. These bumps typically have lateral dimensions of similar to100 nm and rise tens of nanometers above the surrounding surface. Larger, micron-scale scans produce approximately parallel, raised ridges 50-150 nm apart. These structures are stable over time periods of hours or more in air and in solvent. We present evidence that these modifications are due primarily to stress-enhanced solvent uptake in material surrounding the area of tip-polymer contact.
引用
收藏
页码:10225 / 10232
页数:8
相关论文
共 37 条
  • [11] BUNDLE FORMATION OF POLYMERS WITH AN ATOMIC-FORCE MICROSCOPE IN CONTACT MODE - A FRICTION VERSUS PEELING PROCESS
    ELKAAKOUR, Z
    AIME, JP
    BOUHACINA, T
    ODIN, C
    MASUDA, T
    [J]. PHYSICAL REVIEW LETTERS, 1994, 73 (24) : 3231 - 3234
  • [12] MICRO-TRIBOLOGICAL EVALUATIONS OF A POLYMER SURFACE BY ATOMIC FORCE MICROSCOPES
    HAMADA, E
    KANEKO, R
    [J]. ULTRAMICROSCOPY, 1992, 42 : 184 - 190
  • [13] Observation of a polystyrene surface modified by ultrasonic scratching using atomic force microscopy
    Iwata, F
    Matsumoto, T
    Ogawa, R
    Sasaki, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (6B): : 3936 - 3939
  • [14] Scratching on polystyrene thin film without bumps using atomic force microscopy
    Iwata, F
    Matsumoto, T
    Ogawa, R
    Sasaki, A
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06): : 2452 - 2456
  • [15] SUBMICROMETER MODIFICATION OF POLYMER SURFACES WITH A SURFACE FORCE MICROSCOPE
    JIN, X
    UNERTL, WN
    [J]. APPLIED PHYSICS LETTERS, 1992, 61 (06) : 657 - 659
  • [16] AN ATOMIC-FORCE MICROSCOPY STUDY OF POLYESTER SURFACES
    JING, J
    HENRIKSEN, PN
    WANG, H
    MARTENY, P
    [J]. JOURNAL OF MATERIALS SCIENCE, 1995, 30 (22) : 5700 - 5704
  • [17] MICROWEAR PROCESSES OF POLYMER SURFACES
    KANEKO, R
    HAMADA, E
    [J]. WEAR, 1993, 162 (pt A) : 370 - 377
  • [18] Wear mechanisms in reciprocal scratching of polycarbonate, studied by atomic force microscopy
    Khurshudov, A
    Kato, K
    [J]. WEAR, 1997, 205 (1-2) : 1 - 10
  • [19] MANIPULATION OF PROTEINS ON MICA BY ATOMIC FORCE MICROSCOPY
    LEA, AS
    PUNGOR, A
    HLADY, V
    ANDRADE, JD
    HERRON, JN
    VOSS, EW
    [J]. LANGMUIR, 1992, 8 (01) : 68 - 73
  • [20] ORIENTATIONAL ORDERING OF POLYMERS BY ATOMIC FORCE MICROSCOPE TIP-SURFACE INTERACTION
    LEUNG, OM
    GOH, MC
    [J]. SCIENCE, 1992, 255 (5040) : 64 - 66