Complex electrical permittivity of the monolayer molybdenum disulfide (MoS2) in near UV and visible

被引:115
作者
Mukherjee, Bablu [1 ]
Tseng, Frank [2 ]
Gunlycke, Daniel [2 ]
Amara, Kiran Kumar [3 ]
Eda, Goki [3 ]
Simsek, Ergun [1 ]
机构
[1] George Washington Univ, Washington, DC 20052 USA
[2] Naval Res Lab, Washington, DC 20375 USA
[3] Natl Univ Singapore, Singapore 117548, Singapore
关键词
PHOTOLUMINESCENCE; LAYERS;
D O I
10.1364/OME.5.000447
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Temperature and Fermi energy dependent exciton eigenenergies of monolayer molybdenum disulfide (MoS2) are calculated using an atomistic model. These exciton eigen-energies are used as the resonance frequencies of a hybrid Lorentz-Drude-Gaussian model, in which oscillation strengths and damping coefficients are obtained from the experimental results for the differential transmission and reflection spectra of monolayer MoS2 coated quartz and silicon substrates, respectively. Numerical results compared to experimental results found in the literature reveal that the developed permittivity model can successfully represent the monolayer MoS2 under different biasing conditions at different temperatures for the design and simulation of MoS2 based opto-electronic devices. (C) 2015 Optical Society of America
引用
收藏
页码:447 / 455
页数:9
相关论文
共 25 条
[1]   Atomically thin layers of MoS2 via a two step thermal evaporation-exfoliation method [J].
Balendhran, Sivacarendran ;
Ou, Jian Zhen ;
Bhaskaran, Madhu ;
Sriram, Sharath ;
Ippolito, Samuel ;
Vasic, Zoran ;
Kats, Eugene ;
Bhargava, Suresh ;
Zhuiykov, Serge ;
Kalantar-zadeh, Kourosh .
NANOSCALE, 2012, 4 (02) :461-466
[2]   Theory of neutral and charged excitons in monolayer transition metal dichalcogenides [J].
Berkelbach, Timothy C. ;
Hybertsen, Mark S. ;
Reichman, David R. .
PHYSICAL REVIEW B, 2013, 88 (04)
[3]   Quasiparticle band structure calculation of monolayer, bilayer, and bulk MoS2 [J].
Cheiwchanchamnangij, Tawinan ;
Lambrecht, Walter R. L. .
PHYSICAL REVIEW B, 2012, 85 (20)
[4]   Photoluminescence from Chemically Exfoliated MoS2 [J].
Eda, Goki ;
Yamaguchi, Hisato ;
Voiry, Damien ;
Fujita, Takeshi ;
Chen, Mingwei ;
Chhowalla, Manish .
NANO LETTERS, 2011, 11 (12) :5111-5116
[5]  
Frindt R F, 1963, P ROY SOC LOND A MAT, V273
[6]   How dielectric screening in two-dimensional crystals affects the convergence of excited-state calculations: Monolayer MoS2 [J].
Huser, Falco ;
Olsen, Thomas ;
Thygesen, Kristian S. .
PHYSICAL REVIEW B, 2013, 88 (24)
[7]   Direct Measurement of the Thickness-Dependent Electronic Band Structure of MoS2 Using Angle-Resolved Photoemission Spectroscopy [J].
Jin, Wencan ;
Yeh, Po-Chun ;
Zaki, Nader ;
Zhang, Datong ;
Sadowski, Jerzy T. ;
Al-Mahboob, Abdullah ;
van der Zande, Arend M. ;
Chenet, Daniel A. ;
Dadap, Jerry I. ;
Herman, Irving P. ;
Sutter, Peter ;
Hone, James ;
Osgood, Richard M., Jr. .
PHYSICAL REVIEW LETTERS, 2013, 111 (10)
[8]   Electronic structure of a single MoS2 monolayer [J].
Kadantsev, Eugene S. ;
Hawrylak, Pawel .
SOLID STATE COMMUNICATIONS, 2012, 152 (10) :909-913
[9]   Low-temperature photocarrier dynamics in monolayer MoS2 [J].
Korn, T. ;
Heydrich, S. ;
Hirmer, M. ;
Schmutzler, J. ;
Schueller, C. .
APPLIED PHYSICS LETTERS, 2011, 99 (10)
[10]   Quantitative Raman Spectrum and Reliable Thickness Identification for Atomic Layers on Insulating Substrates [J].
Li, Song-Lin ;
Miyazaki, Hisao ;
Song, Haisheng ;
Kuramochi, Hiromi ;
Nakaharai, Shu ;
Tsukagoshi, Kazuhito .
ACS NANO, 2012, 6 (08) :7381-7388